Atomic force microscopy (AFM) has long served as a cornerstone technique for nanoscale imaging and surface characterisation. Recent advances in noncontact AFM have increasingly harnessed the ...

The world of nanoscale analysis has been revolutionized by the advent of electrical Atomic Force Microscopy (AFM) modes. New possibilities for measuring electrical properties with remarkable precision ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...