Recent and continuing trends in the semiconductor industry pose challenges to IC test-data volumes, test application times, and test costs. The industry has thus far succeeded in containing test costs ...

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...

Adam Hayes, Ph.D., CFA, is a financial writer with 15+ years Wall Street experience as a derivatives trader. Besides his extensive derivative trading expertise, Adam is an expert in economics and ...

The importance of properly integrating test points into a PCB design. Test-point deployment considerations. When it comes to creating a modern electronic design, we live in both the best and the worst ...

Test points for hybrid ATPG/LBIST applications make it easier to reach the ISO 26262 standard of 90% stuck-at coverage for in-system test. The remarkable growth in automotive IC design has prompted a ...

WHITESBURG, Ky. — A student's heartwarming note asking the teacher to give his five bonus points to classmates went viral. It was the WWII exam day. As Winston Lee, a history teacher at Letcher County ...

This was a request that Winston Lee had never heard before in his 12 years of teaching. Lee is a history teacher at Letcher County Central High School in Whitesburg, Kentucky. Last month, scrawled on ...