PRIMES has released the ScanFieldMonitor 2D (SFM 2D), developed to meet the requirements of laser-scanner applications in ...

Researchers have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long-standing ...

(Nanowerk News) University of Wisconsin-Madison engineers have found a way to simultaneously mitigate three types of defects in parts produced using a prominent additive manufacturing technique called ...

Additive manufacturing (AM) techniques increasingly require novel non-destructive inspection methods able to fit smoothly within AM workflows, in particular for the detection of structural defects. A ...

Semiconductors are an integral part of the inner workings of medical devices, assisting in the conductivity between a non-conductor and a conductor to control electricity flow. In turn, the assembly ...

Photo-induced force microscopy (PiFM) offers nanoscale defect characterization in semiconductors, combining chemical specificity with high-resolution imaging.