Researchers review the recent advances of deep learning-basedimage anomaly detection since the rapid development ofdeep learning can bring the capabilities of image anomaly detection into the factory ...

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

Two industry leaders in machine vision and industrial image processing – Basler and MVTec – are independently joining forces with diverse engineering company Siemens. The partners say that, by ...