The Design-for-Test (DFT) methodology is a strong driving force in the cost-effective testing of large-volume commodity items with very short life cycles, like system-on-chip (SoC) devices. It will ...
The clamor for multiple functionalities in next-generation wireless telecom and consumer electronic markets has designers scrambling to adopt a core-based design methodology. However, the lack of ...
One of the most significant design trends of the decade is the widespread use of ARM® multicore processors in systems-on-chip (SoCs). Designers’ ability to easily and cost-effectively employ multiple, ...
Leuven, Belgium, January 22, 2013 – At the European 3D TSV Summit in Grenoble, France on January 22-23, 2013, imec, a world-leading nano-electronics research institute, today announced that together ...
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