BALTIMORE — The prevalence and escalating cost of system-on-chip (SoC) designs are forcing a reexamination of existing approaches to design and test, according to EDA and test industry executives at a ...
BANGALORE, India — With efficient test access architecture of much interest to the SoC design and test community, two researchers at an Indian technical institute have proposed a design-for-test ...
A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...
Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
TOKYO, Dec. 11, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T2000 AiR2X, a next-generation air-cooled test system ...
December 12, 2025 - update was made to reflect changes to the second paragraph. AUSTIN, TX / ACCESS Newswire / December 16, 2025 / BetterWay ™ blood testing by Babson Diagnostics, a science-first ...
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